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Selected Published Papers

You can also see my papers on Academia.edu and/or Researchgate pages.

  1. Katsuichi Kitagawa and Jun Mizojiri: "High-Precision Absolute Distance Measurement of Surface Topography using Wavelength Scanning Interferometry ", Proc. of Symposium on Optical Measurement and Imaging Technology (SOMIT), 5-8 (Tokyo, Oct. 2021) English version(pdf) NEW

  2. Katsuichi Kitagawa and Jun Mizojiri: "Refractive Index Profiling of Multi-layer Optical Fibers using Mach-Zehnder Interferometer ", Proc. of Symposium on Optical Measurement and Imaging Technology (SOMIT), 8-11 (Tokyo, Sept. 2018) English version(pdf)

  3. Katsuichi Kitagawa and Jun Mizojiri: "Simultaneous Measurement of Transparent Plate Surface Topography and Thickness Variation using Arbitrary Wavelength Shifting Interferometry ", Kogaku, 47(4) 165-173 (2018) (in Japanese) pdf English version(pdf)

  4. Katsuichi Kitagawa and Jun Mizojiri: "Measurement of Transparent Plate Surface Topography using Wavelength Shifting Interferometry", Proc. of JSPE Autumn Meeting, 29-30 (Mito, Sept. 2016) (in Japanese)

  5. Masafumi Otsuki, Katsuichi Kitagawa, Takashi Izumi and Mamoru Tohyama, "Development of three-wavelength interferometry (Part 1) ―Calibration-less oil thickness profile measurement by thin film interference color analysis―, " Tribology Conference, 96-99 (Tokyo, May 2016) (in Japanese)

  6. Katsuichi Kitagawa and Masafumi Otsuki, "Multi-layer Transparent Film Thickness Measurement by Interference Color Analysis," Proc. of JSPE Spring Meeting, 999-1000 (Tokyo, March 2016) (in Japanese) English version(pdf)

  7. Katsuichi Kitagawa and Jun Mizojiri: "Refractive Index Profiling of Axially Symmetric Optical Fibers using Mach-Zehnder Interferometer and Model Matching Method", Proc. of JSPE Spring Meeting, 1003-1004 (Tokyo, March 2016) (in Japanese) English version(pdf)

  8. Masafumi Otsuki and Katsuichi Kitagawa, "Thickness Profiler by Three Wavelength Interference Color Analysis," International Tribology Conference, 996-997 (Tokyo, Sept. 2015)

  9. Katsuichi Kitagawa and Jun Mizojiri: "Measurement of Transparent Plate Surface Topography using Wavelength Scanning Interferometry", Proc. of Symposium on Optical Measurement and Imaging Technology (SOMIT), 40-43 (Tokyo, Sept. 2015).English version(pdf)

  10. Katsuichi Kitagawa and Jun Mizojiri: "Simultaneous Measurement of Transparent Plate Surface Topography and Thickness Variation using Wavelength Scanning Interferometry", Proc. of JSPE Autumn Meeting, 771-772 (Sendai, Sept. 2015) (in Japanese)

  11. Katsuichi Kitagawa and Masafumi Otsuki: "Semi-transparent Film Thickness Measurement by Interference Color Analysis", Proc. of JSPE Autumn Meeting, 769-770 (Sendai, Sept. 2015) (in Japanese) English version(pdf)

  12. Katsuichi Kitagawa: Chapter 29 Film surface and thickness profilometry, in "Handbook of Optical Metrology -Principles and Applications-, Second Edition", Edited by Toru Yoshizawa, CRC Press (2015)

  13. Tomoya Sakai, Masashi Sugiyama, Katsuichi Kitagawa, Kazuyoshi Suzuki: "Registration of infrared transmission images using squared-loss mutual information," Precision Engineering, Vol. 39, 187-193 (January 2015).

  14. Katsuichi Kitagawa, "Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry," Optics Letters 39, 4172-4175 (2014) Abstract. pdf

    **This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-14-4172. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

  15. Yoshinori Iketaki, Katsuichi Kitagawa, Kohjiro Hidaka, Naoki Kato, Akira Hirabayashi and Nandor Bokor: "Fabrication of optical multilayer for two-color phase plate in super-resolution microscope", Rev. Sci. Instrum., 85, 073701 (2014) Online

  16. Katsuichi Kitagawa: "Surface and thickness measurement of a transparent film using three-wavelength interferometry", Proceedings of the 14th euspen International Conference, pp. 189-192 (Dubrovnik; June 2014) Manuscript(pdf)

  17. Katsuichi Kitagawa: "Optimum Wavelength Selection to Extend the Unambiguous Measurement Range of the Three-wavelength Single-shot Interferometry", Transactions of SICE, 50(4), 335-341 (2014) (in Japanese) J-STAGE Manuscript(pdf) English version(pdf)

  18. Katsuichi Kitagawa: [Keynote speech] "Twenty Years of R&D on Optical Interferometry for Industrial Applications", Proc. of JSPE Spring Meeting (Tokyo, March 2014) (in Japanese).English version(pdf)

  19. Katsuichi Kitagawa: "Simultaneous Measurement of Film Surface Topography and Thickness Variation using Three-Wavelength Interferometry", Proc. of Vision Engineering Workshop (ViEW) 2013, OS2-O3 (Yokohama, Dec. 2013) (in Japanese) English version(pdf)

  20. Katsuichi Kitagawa and Masafumi Otsuki: "Wide-view Transparent Film Thickness Measurement System by Interference Color Analysis", J. Jpn. Soc. Precis. Eng., 79 (11), 1078-1082 (2013) (in Japanese) Manuscript(pdf) [This paper received the JSPE Numata Memorial Paper Award 2013]

  21. Katsuichi Kitagawa: "Sensitivity Analysis of Transparent Film Thickness Measurement by Three-wavelength Interference Color Analysis Method", Proc. of JSPE Autumn Meeting, 389-390 (Osaka, Sept. 2013) (in Japanese) English version(pdf)

  22. Katsuichi Kitagawa: "Thin-film thickness profile measurement by three wavelength interference color analysis", Applied Optics, Vol. 52, Iss. 10, pp. 1998-2007 (2013) Abstract pdf (Open Access) [A paper selected for Spotlight on Optics of OSA in May 2013]

  23. Katsuichi Kitagawa: "Optimum Wavelength Selection for the Three-Wavelength Interferometry", Proc. of JSPE Spring Meeting, 5-6 (Tokyo, March 2013) (in Japanese)

  24. Katsuichi Kitagawa, Masafumi Otsuki and Tatsuhiko Tsuboi: "Transparent Film Thickness Measurement by Interference Color Analysis ", Proc. of Vision Engineering Workshop (ViEW) 2012, OS4-H6 (Yokohama, Dec. 2012) (in Japanese)

  25. Katsuichi Kitagawa: "Transparent film thickness measurement by three-wavelength interference method: An extended application of Global Model Fitting algorithm", 9th France-Japan & 7th Europe-Asia Congress on and Research and Education in Mechatronics (REM), (Paris, Nov. 2012) Abstract Manuscript(pdf)

  26. Katsuichi Kitagawa: "Simultaneous Measurement of Film Surface Topography and Thickness Variation using Three-wavelength Interferometry -Model-based Separation Algorithm of Two Overlapped Sinusoidal Signals-", Proc. of JSPE Autumn Meeting, 619-620 (Kitakyushu, Sept. 2012) (in Japanese) English version(pdf)

  27. Katsuichi Kitagawa and Masafumi Otsuki: "Development of Transparent Film Thickness Measurement System by Three-wavelength Interference Method -Extension of Global Model Fitting Algorithm-", Proc. of JSPE Autumn Meeting, 621-622 (Kitakyushu, Sept. 2012) (in Japanese)

  28. Akihiro Yamashita, Masashi Sugiyama, Katsuichi Kitagawa, and Hisashi Kobayashi: "Multiwavelength-integrated local model fitting method for interferometric surface profiling", Applied Optics, 51 (28), 6700-6707 (2012) Abstract.

  29. Katsuichi Kitagawa: "Single-shot interferometry without carrier fringe introduction." SPIE Newsroom (August 21, 2012). http://spie.org/x88848.xml. DOI: 10.1117/2.1201207.004360.

  30. Katsuichi Kitagawa: "Thickness Profile Estimation from Three Wavelength Interference Color Image using Model Fitting Method", Conference Reports of the JSPE Technical Committee on Industrial Application of Image Processing (IAIP), 27 (1) 21-26 (Tokyo, May 2012) (in Japanese). English version(pdf)

  31. Katsuichi Kitagawa, "Single-shot surface profiling by multiwavelength interferometry without carrier fringe introduction", J. Electron. Imaging 21, 021107 (May 10, 2012) Abstract Manuscript(pdf)

  32. Katsuichi Kitagawa: "Transparent film thickness measurement by three-wavelength interference method -An extended application of Global Model Fitting Algorithm-", Proc. of JSPE Spring Meeting, 1037-1038 (Tokyo, March 2012) (in Japanese)

  33. Akihiro Yamashita, Masashi Sugiyama, Katsuichi Kitagawa and Hisashi Kobayashi: "Multiwavelength-Integrated Local Model Fitting Method for Interferometric Surface Profiling", Proc. of JSPE Spring Meeting, 1027-1028 (Tokyo, March 2012) (in Japanese)

  34. Katsuichi Kitagawa, Tatsuhiko Tsuboi, Hiroki Sugihara, Masaru Sugiyama and Hidemitsu Ogawa: "Development of Multi-Wavelength Single-Shot Interferometry and Its Practical Application", J. Jpn. Soc. Precis. Eng., 78(2）112-116（2012） (in Japanese) [<Special Issue> 2011 JSPE Technology Award]

  35. Katsuichi Kitagawa, Hiroki Sugihara, Tatsuhiko Tsuboi, Kazuyoshi Suzuki and Masafumi Otsuki: "Automatic Film Thickness Measurement System for Inkjet-Based Color Filters Based on Three-Wavelength Single-Shot Interferometry", J. Jpn. Soc. Precis. Eng., 78(1）86-91（2012） (in Japanese) [This paper received the JSPE Best Paper Award 2012]

  36. Katsuichi Kitagawa: "Crosstalk Coefficient Estimation for Three-Wavelength Single-shot Interferometry by Model Fitting Technique", SICE Trans. on Industrial Application, 10(25), 209-212 (2011) (in Japanese) pdf English version(pdf)

  37. Katsuichi Kitagawa: "Single-shot multi-wavelength interferometry without carrier fringe introduction", Proc. of Vision Engineering Workshop (ViEW) 2011, 456-463 (Yokohama, Dec. 2011) (in Japanese)

  38. Katsuichi Kitagawa, Tatsuhiko Tsuboi and Hisashi Kobayashi: "Development of Real-Time Three-Wavelength Single-Shot Interferometry", Proc. of JSPE Autumn Meeting, 816-817 (Kanazawa, Sept. 2011) (in Japanese)

  39. Katsuichi Kitagawa: "Development of a Surface Profiler Based on Three-Wavelength Phase-Shifting Interferometry", Proc. of JSPE Autumn Meeting, 812-813 (Kanazawa, Sept. 2011) (in Japanese) English version(pdf)

  40. Syogo Mori, Masashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, and Kei Irie, "Automatic parameter optimization of the local model fitting method for single-shot surface profiling," Appl. Opt. 50, 3773-3780 (2011) Abstract

  41. Katsuichi Kitagawa: "Multi-wavelength single-shot interferometry without carrier fringe introduction", 10th International Conference on Quality Control by Artificial Vision (QCAV2011) [Saint-Etienne, France], Proc. of SPIE Vol. 8000, 800009, (June 2011) [Selected best papers of QCAV2011] Abstract Manuscript(pdf)

  42. Katsuichi Kitagawa: [Keynote speech] "Single-shot interferometry: past, present, and future", Proc. of JSPE Spring Meeting, 1027-1028 (2011) (in Japanese) English version(pdf)

  43. Katsuichi Kitagawa: "Study on industrial surface profile measurement method based on optical interferometry", Doctoral Dissertation, University of Tokyo (2011) (in Japanese).
    Ch.2 High-speed white light interferometry [English version(pdf)] NEW
    Ch.3 High-accuracy white light interferometry [English version(pdf)] NEW
    Ch.4 Transparent Film Profilometry [English version(pdf)] NEW
    Ch.5 Thickness Profile Measurement of Free-Standing Transparent Film [English version(pdf)] NEW
    Ch.6 Local Model Fitting (LMF) Method [English version(pdf)] NEW
    Ch.7 Two-wavelength single-shot interferometry [English version(pdf)] NEW
    Ch.8 Three-wavelength single-shot interferometry [English version(pdf)] NEW
    Ch.9 Range extention by optimum wavelength selection [English version(pdf)] NEW
    Ch.10 Automatic film thickness measurement system for ink-jet type color filters [English version(pdf)] NEW

  44. K. Kitagawa, H. Sugihara, T. Tsuboi, K. Suzuki and M. Otsuki, "Automatic Film Thickness Measurement System for Inkjet-Based Color Filters Based on Three-Wavelength Single-Shot Interferometry", Proc. of Vision Engineering Workshop (ViEW) 2010, 392-396 (2010) (in Japanese)

  45. Katsuichi Kitagawa and Hiroki Sugihara: "Speed Improvement of Automatic Film Thickness Measurement System for Inkjet-Based Color Filters Based on Three-Wavelength Single-Shot Interferometry - By Using a Multi-Wavelength Filter and GPU -", Proc. of JSPE Autumn Meeting, 781-782 (Nagoya, Sept. 2010) (in Japanese) [Selected best presentations]

  46. Katsuichi Kitagawa: "Multi-Wavelength Single-Shot Interferometry by Global Model Fitting", Proc. of JSPE Autumn Meeting, 777-778 (Nagoya, Sept. 2010) (in Japanese)

  47. Nozomi Kurihara, Masashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, and Kazuyoshi Suzuki: "Iteratively-reweighted local model fitting method for adaptive and accurate single-shot surface profiling," Appl. Opt. 49, 4270-4277 (2010) Abstract

  48. Katsuichi Kitagawa: "Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry", International Journal of Optomechatronics, 4(2) 136-156 (2010) Abstract Manuscript(pdf)

  49. Katsuichi Kitagawa: Chapter 29 Film surface and thickness profilometry, in "Handbook of Optical Metrology -Principles and Applications-", Edited by Toru Yoshizawa, CRC Press (2009)

  50. Takuto Naito, Masaru Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa and Kazuyoshi Suzuki : "Single-shot Interferometry of Film-covered Objects", J. Jpn. Soc. Precis. Eng., 75(11）1315-1322（2009） (in Japanese)

  51. Katsuichi Kitagawa: Multi-Wavelength Single-Shot Interferometry, ISOT 2009 (International Symposium on Optomechatronic Technologies) (Sept. 2009; Istanbul) [Innovation Award Nominated] Abstract Manuscript(pdf)

  52. Katsuichi Kitagawa: "Crosstalk Compensation for Three-Wavelength Interferometry", SICE Trans. on Industrial Application, 8(14), 113-116 (2009) (in Japanese) pdf English version(pdf)

  53. Katsuichi Kitagawa: "Two-Dimensional Frequency Estimation for Fringe Analysis by Phase Gradient Detection", SICE Trans. on Industrial Application, 8(13), 108-112 (2009) (in Japanese) pdf English version(pdf)

  54. Tatsuya Yokota, Masashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, and Kazuyoshi Suzuki, "Interpolated local model fitting method for accurate and fast single-shot surface profiling," Appl. Opt. 48, 3497-3508 (2009) Abstract

  55. Katsuichi Kitagawa: "Two-Dimensional Frequency Estimation for Fringe Analysis by Phase Gradient Detection", Proc. of JSPE Autumn Meeting, 169-170 (Tokyo, Sept. 2009) (in Japanese)

  56. Hitemitsu Ogawa, Akihiro Nakanowatari, Katsuichi Kitagawa, Masashi Sugiyama and Takuto Naito: "Simultaneous Measurement of Film Thickness and Surface Profile of Film-covered Objects by Monochromatic Light Interferometry", Trans. of SICE, 45(2), 73-82 (2009) (in Japanese)

  57. Katsuichi Kitagawa: [Invited talk] Recent Trends in Super-Precision 3D Measurement Technology - Innovative Algorithms for Optical Interferometry and their Applications-, FCV 2009　(15th Japan-Korea Joint Workshop on Frontiers of Computer Vision),　Korea Student Advancement Center, Andong, Korea (Feb. 2009) slide(pdf)

  58. Katsuichi Kitagawa, Masaru Sugiyama, Takuya Matsuizaka, Hidemitsu Ogawa and Kazuyoshi Suzuki: "Two-Wavelength Single-Shot Interferometry", J. Jpn. Soc. Precis. Eng., 75(2）273-277（2009） (in Japanese)

  59. Katsuichi Kitagawa: "Three-Wavelength Single-Shot Interferometry", Proc. of Vision Engineering Workshop (ViEW) 2008, 5-10 (Yokohama, Dec. 2008) (in Japanese)

  60. Takuto Naito, Masashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, Kazuyoshi Suzuki: "Single-shot Interferometry of Film-covered Objects -Local Model Fitting for Simultaneous Measurement of Film Thickness and Surface Profile of Film-covered Objects-", Proc. of JSPE Autumn Meeting, 183-184 (Sendai, Sept. 2008) (in Japanese)

  61. Katsuichi Kitagawa: "Three-Wavelength Single-Shot Interferometry", Proc. of JSPE Autumn Meeting, 183-184 (Sendai, Sept. 2008) (in Japanese)

  62. Katsuichi Kitagawa, Masashi Sugiyama, Takuya Matsuzaka, Hidemitsu Ogawa,and Kazuyoshi Suzuki, "Two-Wavelength Single-Shot Interferometry", Proc. of Vision Engineering Workshop (ViEW) 2007, 87-92 (2007) (in Japanese)

  63. Katsuichi Kitagawa: [Invited] Thin Film Thickness Profile Measurement using an Interferometric Surface Profiler, ISOT 2007 (International Symposium on Optomechatronic Technologies) (Lausanne, Oct. 2007); Optomechatronic Sensors and Instrumentation III, edited by Rainer Tutsch, Hong Zhao,Katsuo Kurabayashi, Yasuhiro Takaya, Pavel Tomanek, Proc. of SPIE Vol. 6716, 671607, (2007) Abstract Manuscript(pdf)

  64. Katsuichi Kitagawa: "Simultaneous measurement of refractive index and thickness of transparent films by white-light interferometry", Proc. of JSPE Autumn Meeting, 461-462 (Asahikawa, Sept. 2007) (in Japanese) English version(pdf)

  65. Katsuichi Kitagawa, M. Sugiyama, T. Matsuzaka, H. Ogawa, and K. Suzuki, "Two-Wavelength Single-Shot Interferometry", Proc. of SICE Annual Conference 2007 in Takamatsu,724-728 (2007) Abstract Manuscript(pdf)

  66. Katsuichi Kitagawa: "Thickness Profile Measurement of a Transparent Film using Transmission Interferometry", Proc. of 2007 Symposium on Optical Measurement and Imaging Technology, 77-80 (Yokohama, June 2007) (in Japanese) English version(pdf)

  67. M. Sugiyama, H. Ogawa, Katsuichi Kitagawa, and K. Suzuki, "Single-shot surface profiling by local model fitting," Appl. Opt. 45, 7999-8005 (2006) Abstract

  68. Katsuichi Kitagawa: [Invited] Recent Advances in White-Light Interferometry - Speed Improvement and Transparent Film Profiling -, OSA OF&T 2006 (Rochester, New York; Oct. 2006) Abstract Manuscript(pdf)

  69. Katsuichi Kitagawa: [Invited] Simultaneous Measurement of Film Surface Topography and Thickness Variation using White-Light Interferometry, Optics East 2006 (Boston, Oct. 2006) ;Proceedings of SPIE -- Volume 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems, Yasuhiro Takaya, Jonathan Kofman, Editors, 637507 (Oct. 12, 2006) Abstract Manuscript(pdf)

  70. Katsuichi Kitagawa: [Invited] Recent trends in white light interferometry, Optics East 2006 (Boston, Oct. 2006) ;Two- and Three-Dimensional Methods for Inspection and Metrology IV. Edited by Huang, Peisen S.. Proceedings of the SPIE, Volume 6382, pp. (2006). Abstract Manuscript(pdf)

  71. K. Kitagawa: "An Industrial Application of the Sampling Theory - A Novel Algorithm for Interferometric Surface Profiling - ", Proc. of IEICE Engineering Sciences Society Conf., AP-6-4 (Tokyo, March 2006) (in Japanese) English version(pdf)

  72. Katsuichi Kitagawa: "Development of 3-D Surface Profiler for Film-covered Objects using Phase-Shifting Interferometry", Proc. of JSPE Spring Meeting, 377-378 (Tokyo, March 2005) (in Japanese)

  73. T. Shimizu, T. Kurihara, N. Ono, S. Ando, and Katsuichi Kitagawa: "Real-Time En-face Optical Coherence Tomography Using Correlation Image Sensor", Proc. of the 21th Sensor Symposium，441-444 (Kyoto, Oct. 2004)

  74. Katsuichi Kitagawa: "3-D Profiling of a Transparent Film using White-Light Interferometry", Proc. of SICE Annual Conference 2004, TAI-7-2, 585-590 (Sapporo, August 2004) Manuscript(pdf)

  75. Katsuichi Kitagawa: "3-D Shape Measurement of a Transparent Film using White-Light Interferometry ", Proc. of Vision Engineering Workshop (ViEW) 2003, 87-92 (Yokohama, Dec. 2003) (in Japanese) [Best Paper Award (Odawara Award)] English version(pdf)

  76. A. Hirabayashi, Y. Nakayama, H. Ogawa, Katsuichi Kitagawa:"Algorithm with Optimum Noise Suppression for Surface Profiling by White-Light Interferometry", Proc. of SPIE Annual Meeting 2003, vol.5180, 365-376 (August 2003) Abstract

  77. A. Hirabayashi, H. Ogawa, Katsuichi Kitagawa:"Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory", Appiled Optics, vol.41, no.23, 4876-4883 (2002) Abstract

  78. A. Hirabayashi, H. Ogawa, Katsuichi Kitagawa:"Fast Surface Profiler by White-Light Interferometry Using a New Algorithm, the SEST Algorithm", Proc. of SPIE Annual Meeting 2001, vol.4451,356/367 (August 2001) Abstract

  79. H. Ogawa, A. Hirabayashi, K. Kitagawa:"Sampling Theorem for Surface Profiling by White-Light Interferometry", Proceeding of SampTA 2001,91-96 (May 2001)

  80. Katsuichi Kitagawa, Akira Hirabayashi, Hidemitsu Ogawa and Tatsuya Mizutani: "Fast Surface Profiler using Narrow-Band White-Light Interferometry - Application of the Sampling Theorem for Band-Pass Signals -", Proc. of SICE Annual Conference 2000, 103D-4 (Kitakyushu, July 2000) (in Japanese) [2001 SICE Technology Award] English version(pdf)

  81. Akira Hirabayashi, Hidemitsu Ogawa, Tatsuya Mizutani, Ken Nagai and Katsuichi Kitagawa: "Fast Surface Profiling by White-Light Interferometry Using a Sampling Theorem for Band-Pass Signals", Transactions of SICE, 36(1), 16-25 (2000) (in Japanese)