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  • @Œv‘ª§ŒäƒGƒ“ƒWƒjƒAiŒv‘ªŽ©“®§ŒäŠw‰ï”F’èj
  • @‰pŒŸ1‹‰i1971”Nj
  • @TOEIC 905“_

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  • @2000-2013@“ŒƒŒƒGƒ“ƒWƒjƒAƒŠƒ“ƒOiŠ”j
  • @1964-2000@“ŒƒŒiŠ”j

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  • @2008@•xŽRŒ§—§‘åŠw HŠw•”

Žå‚È•\²—ðF

  • @Œv‘ªŽ©“®§ŒäŠw‰ï‹ZpÜi2001”N“xj
  • @ViEWiƒrƒWƒ‡ƒ“‹Zp‚ÌŽÀ—˜—pƒ[ƒNƒVƒ‡ƒbƒvj2003‚ɂﬓcŒ´ÜiÅ—DG˜_•¶Üj
  • @Žè“‡‹L”Oà’c”­–¾Ü(2004”N)
  • @Œv‘ªŽ©“®§ŒäŠw‰ï2011”N“xCPDƒ|ƒCƒ“ƒg‚“¾“_ŽÒÜ
  • @¸–§HŠw‰ï‹ZpÜi2011”N“xj
  • @Œv‘ªŽ©“®§ŒäŠw‰ï2012”N“xCPDƒ|ƒCƒ“ƒg‚“¾“_ŽÒÜ
  • @¸–§HŠw‰ï˜_•¶Üi2012”N“xj
  • @¸–§HŠw‰ïÀ“c‹L”O˜_•¶Üi2013”N“xj

Žå‚È’˜‘F

  • –kìŽˆêi‹¤–óC•ÒWjFP. S. Buckley (Œ´’˜)u‰»ŠwƒvƒƒZƒX§Œä\‚»‚Ì—˜_‚ÆŽÀÛvC‰»Šw“¯l (1970)
  • –kìŽˆêi•ª’SŽ·•MjF‘æ17Í ‚•ªŽq‰»ŠwH‹ÆC¬–ì–Ø dŽ¡ ‚Ù‚©•Òu‰»ŠwŒv‘ªƒnƒ“ƒhƒuƒbƒNvC470-489C’©‘q‘“X (1974)
  • –kìŽˆêi•ª’SŽ·•MjFTABŒŸ¸‘•’uCuƒ}ƒ‹ƒ`ƒ`ƒbƒvŽÀ‘•‹ZpvC193-205CƒgƒŠƒPƒbƒvƒX (1991)
  • –kìŽˆêi•ª’SŽ·•MjFuŒõ‹Zp‘‡Ž–“TvCƒIƒvƒgƒƒjƒNƒXŽÐ (2004)
  • –kìŽˆêi•ª’SŽ·•MjF12.4ß ƒCƒ[ƒWƒ“ƒO‹ZpCuŽŸ¢‘ãƒZƒ“ƒTƒnƒ“ƒhƒuƒbƒNv 510-522C”|•—ŠÙ (2008)
  • –kìŽˆêi•ª’SŽ·•MjF5.2ß Œ°”÷‹¾‚É‚æ‚éŽOŽŸŒ³Œv‘ª-ŒõŠ±Â–@-CuÅV ŒõŽOŽŸŒ³Œv‘ªvi‹gàV“O •Ò’˜j, 66-73, ’©‘q‘“X (2006)
  • –kìŽˆêi•ª’SŽ·•MjF‘æ7Í Š±Â•ÒCuŒõŠwŽÀ–±Ž‘—¿Wv, 119-132Cî•ñ‹@\ (2006)
  • –kìŽˆêi•ª’SŽ·•MjF5.4ß ŒõŠ±Â–@‚É‚æ‚é•\–ÊŒ`óŒv‘ª‚ÌŒ»ó‚Æ“W–]CuƒtƒBƒ‹ƒ€EƒKƒ‰ƒX‚Ì•\–ʏˆ—‹Zp‚Æ‚»‚Ì•]‰¿E•ªÍv, 212-219, î•ñ‹@\ (2007)
  • K. Kitagawai•ª’SŽ·•Mj: Chapter 29 - Film surface and thickness profilometry, in "Handbook of Optical Metrology - Principles and Applications -", Edited by Toru Yoshizawa, 677-690, CRC Press (2009)

Žå‚ȍ‘Û‰ï‹cu‰‰F

  • Continuous measurement of the quality of textured filament yarns, 18th International Man-Made Fiber Conference, Dornbirn, Austria (1979)
  • New particle counter using spatial filtering technique, Display Manufacturing Technology Conference, San Jose, USA, 105-108 (1999)
  • [Invited] Recent trends in white light interferometry, Optics East 2006, Boston, USA (2006).
  • [Invited] Simultaneous measurement of film surface topography and thickness variation using white-light interferometry, Optics East 2006, Boston, USA (2006)
  • [Invited] Recent advances in white-light interferometry - Speed improvement and transparent film profiling -, OSA Optical Fabrication and Testing(OFT) 2006, Rochester, USA (2006)
  • [Invited] Thin film thickness profile measurement using an interferometric surface profiler, ISOT 2007 (International Symposium on Optomechatronic Technologies), Lausanne, Switzerland (2007)
  • [Invited Talk] Recent trends in super-precision 3D measurement technology - Innovative algorithms for optical interferometry and their applications-, FCV 2009 (15th Japan-Korea Joint Workshop on Frontiers of Computer Vision), Andong, Korea (2009)
  • Multi-wavelength single-shot interferometry, Int. Symposium on Optomechatronic Technologies (ISOT 2009), Istanbul (2009)
  • Multi-wavelength single-shot interferometry without carrier fringe introduction, 10th International Conference on Quality Control by Artificial Vision (QCAV2011), Saint-Etienne, France (2011)
  • Transparent film thickness measurement by three-wavelength interference method: An extended application of Global Model Fitting algorithm, ‘æ9‰ñ“ú•§ƒƒJƒgƒƒjƒNƒX‰ï‹c; Paris (2012)
  • Surface and thickness measurement of a transparent film using three-wavelength interferometry, the 14th euspen International Conference, Dubrovnik, Croatia (2014)

Žå‚Ș_•¶F

  • –kìŽˆê, ™ŽR«, ¼â‘ñÆ,¬ì‰pŒõ, —é–؈ê‰Ã:u‚Q”g’·ƒƒ“ƒVƒ‡ƒbƒgŠ±ÂŒv‘ªvA¸–§HŠw‰ïŽ, vol.75, No.2. 273-277 (2009) jstageipdfj
  • –kìŽˆêFuˆÊ‘ŠŒù”zŒŸo‚É‚æ‚銱ÂŽÈ‰æ‘œ‚Ì‚QŽŸŒ³Žü”g”„’èvAŒv‘ªŽ©“®§ŒäŠw‰ïŽY‹Æ˜_•¶W, vol. 8 (13), pp.108/112 (2009) pdf
  • –kìŽˆêFu‚R”g’·Š±ÂŒv‘ª‚Ì‚½‚߂̃NƒƒXƒg[ƒN•â³vAŒv‘ªŽ©“®§ŒäŠw‰ïŽY‹Æ˜_•¶W, vol. 8 (14), pp.113/116 (2009) pdf
  • Katsuichi Kitagawa: "Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry", International Journal of Optomechatronics, 4(2) 136-156 (2010) Abstract
  • –kìŽˆêC™Œ´—mŽ÷C’؈ä’C•FC—é–؈ê‰ÃC‘å’ΐ^¶•¶Fu‚R”g’·ƒƒ“ƒVƒ‡ƒbƒgŠ±ÂŒv‘ª‚É‚æ‚éƒCƒ“ƒNƒWƒFƒbƒg•ûŽ®ƒJƒ‰[ƒtƒBƒ‹ƒ^‚Ì–ŒŒú‘ª’èv, ¸–§HŠw‰ïŽ, 78 (1), 86-91 (2012) jstageipdfj y¸–§HŠw‰ï 2012”N“x˜_•¶ÜŽóÜz
  • Katsuichi Kitagawa, "Single-shot surface profiling by multiwavelength interferometry without carrier fringe introduction", J. Electron. Imaging 21, 021107 (May 10, 2012)
  • Katsuichi Kitagawa: "Thin-film thickness profile measurement by three wavelength interference color analysis", Applied Optics, Vol. 52, Iss. 10, pp. 1998-2007 (2013) Abstract pdf (Open Access) yA paper selected for Spotlight on Optics of OSA in May 2013z
  • –kìŽˆêC ‘å’ΐ^¶•¶FuŠ±ÂF‰æ‘œ‰ðÍ‚É‚æ‚铧–¾–Œ‚̍LŽ‹–ì–ŒŒú•ª•z‘ª’è‘•’u‚ÌŠJ”­v, ¸–§HŠw‰ïŽ, 79 (11), 1078-1082 (2013) y¸–§HŠw‰ï 2013”N“x˜_•¶ÜŽóÜz
  • –kìŽˆêF u3”g’·ƒƒ“ƒVƒ‡ƒbƒgŠ±ÂŒv‘ª‚É‚¨‚¯‚éÅ“K”g’·‘I‘ð‚Æ‘ª’背ƒ“ƒWŠg‘åvCŒv‘ªŽ©“®§ŒäŠw‰ï˜_•¶WAVol.50ANo.4 (2014”N4ŒŽ) Abstract
  • Katsuichi Kitagawa, "Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry", Optics Letters 39, 4172-4175 (2014) Abstract
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BXM02060—nifty.ne.jp
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katsuichi.kitagawa—nifty.com

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