[Japanese/English Home]

Katsuichi Kitagawa

Optical Metrology Specialist

Educational History

University of Tokyo PhD Information Science & Technology 2011
University of Tokyo BS Applied Physics 1964
Urakawa High School @ @ 1960

Work Experience

Toray Engineering Co.

Senior Technical Advisor


Toray Industries, Inc.

General Manager of Electronics Development Center


Toray Industries, Inc.

Instruments and Control Engineer



1st Grade of the STEP Test (in Practical English Proficiency) 1971
Advanced Measurement & Control Engineer (authorized by SICE) 2006


SICE Technology Award July 2001
ViEW Odawara Award (Best Paper Award) Dec. 2003
Seiichi Tejima Invention Award Mar. 2004
JSPE Technology Award Sept. 2011
JSPE Best Paper Award Mar. 2012
JSPE Numata Memorial Paper Award Mar. 2013

Patents, Publications and Invited Talks

  • more than 30 issued patents.
  • more than 100 written publications and invited talks on image processing and interferometry. [Selected Published Papers]


Chapter 29 - Film surface and thickness profilometry, in "Handbook of Optical Metrology - Principles and Applications -", Edited by Toru Yoshizawa, 677-690, CRC Press 2009