Katsuichi Kitagawa

Optical Metrology Specialist

Educational History

University of Tokyo	PhD	Information Science & Technology	2011
University of Tokyo	BS	Applied Physics	1964
Urakawa High School			1960

Work Experience

Independent Consultant		2013-
Toray Engineering Co.	Senior Technical Advisor	2000-2013
Toray Industries, Inc.	General Manager of Electronics Development Center	1992-2000
Toray Industries, Inc.	Instruments and Control Engineer	1964-1992

Qualifications

Advanced Measurement & Control Engineer (authorized by SICE)	2006
1st Grade of the STEP Test (in Practical English Proficiency)	1971

Awards

JSPE Numata Memorial Paper Award	Mar. 2013
JSPE Best Paper Award	Mar. 2012
JSPE Technology Award	Sept. 2011
Seiichi Tejima Invention Award	Mar. 2004
ViEW Odawara Award (Best Paper Award)	Dec. 2003
SICE Technology Award	July 2001

Patents, Publications and Invited Talks

more than 30 issued patents.
more than 100 written publications and invited talks on image processing and interferometry. [Selected Published Papers]

Books

Chapter 29 - Film surface and thickness profilometry, in "Handbook of Optical Metrology - Principles and Applications -", Edited by Toru Yoshizawa, 677-690, CRC Press

2009